The Japan Society of Applied Physics

[P-3-24] Re-examination of 1/f Noise in FD-SOI for Practical Usage of Analog Circuits

Anil Kumar、Yasuhiro Domae、Noriyuki Miura、Tomohiro Okamura、Hirotaka Komatsubara、Yukihiro Kita、Jiro Ida (1.Semiconductor R&D Division, Oki Electric Industry Co. Ltd.)

https://doi.org/10.7567/SSDM.2006.P-3-24