Re-examination of 1/f Noise in FD-SOI for Practical Usage of Analog Circuits

Anil Kumar; Yasuhiro Domae; Noriyuki Miura; Tomohiro Okamura; Hirotaka Komatsubara; Yukihiro Kita; Jiro Ida

doi:https://doi.org/10.7567/SSDM.2006.P-3-24

2006 International Conference on Solid State Devices and Materials

2006年9月12日〜 2006年9月15日
PACIFICO Yokohama, Yokohama, Japan

[P-3-24] Re-examination of 1/f Noise in FD-SOI for Practical Usage of Analog Circuits

Anil Kumar、Yasuhiro Domae、Noriyuki Miura、Tomohiro Okamura、Hirotaka Komatsubara、Yukihiro Kita、Jiro Ida (1.Semiconductor R&D Division, Oki Electric Industry Co. Ltd.)

https://doi.org/10.7567/SSDM.2006.P-3-24

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