[B-1-6] New Observations on the Narrow Width Effect of the Hot Carrier and NBTI Reliabilities in pMOSFETs with Various Types of Strains

S. S. Chung、D. C. Huang、C. S. Lai、C. H. Tsai、P. W. Liu、Y. H. Lin、C. T. Tsai、G. H. Ma、S. C. Chien、S. W. Sun (1.Department of Electronic Engineering, National Chiao Tung University, Taiwan、2.Chang-Gung University, Taiwan、3.United Microelectronics Corporation (UMC), Central R&D Division, Taiwan)

https://doi.org/10.7567/SSDM.2007.B-1-6