[B-10-2] Analysis of Random Telegraph Signal Noise in Dual and Single Oxide Device And Its Application to CMOS Image Sensor Readout Circuit

Hochul Lee、Youngchang Yoon、Jongwook Jeon、Hyungcheol Shin (1.Seoul National Univ. Dept.)

https://doi.org/10.7567/SSDM.2007.B-10-2