[B-10-5] Frequency Dependence of Measured MOSFET Distortion Characteristic

T. Minami, Y. Takeda, M. Miyake, M. Miura-Mattausch, H. J. Mattausch, T. Ohguro, T. Iizuka, M. Taguchi, S. Miyamoto (1.Graduate School of Advanced Sciences of Matter, Hiroshima University, 2.Semiconductor Technology Academic Research Center)

https://doi.org/10.7567/SSDM.2007.B-10-5