[B-10-5] Frequency Dependence of Measured MOSFET Distortion Characteristic

T. Minami、Y. Takeda、M. Miyake、M. Miura-Mattausch、H. J. Mattausch、T. Ohguro、T. Iizuka、M. Taguchi、S. Miyamoto (1.Graduate School of Advanced Sciences of Matter, Hiroshima University、2.Semiconductor Technology Academic Research Center)

https://doi.org/10.7567/SSDM.2007.B-10-5