High Sensitivity Dynamic Range Enhanced CMOS Imager with Noise Suppression

Satoru Adachi; Woonghee Lee; Nana Akahane; Hiromichi Oshikubo; Koichi Mizobuchi; Shigetoshi Sugawa

doi:https://doi.org/10.7567/SSDM.2007.G-9-2

2007 International Conference on Solid State Devices and Materials

Sep 18, 2007 - Sep 21, 2007
Tsukuba International Congress Center (EPOCHAL TSUKUBA), Ibaraki, Japan

[G-9-2] High Sensitivity Dynamic Range Enhanced CMOS Imager with Noise Suppression

Satoru Adachi, Woonghee Lee, Nana Akahane, Hiromichi Oshikubo, Koichi Mizobuchi, Shigetoshi Sugawa (1.DISP Development, Texas Instruments Japan, 2.Graduate School of Engineering, Tohoku University)

https://doi.org/10.7567/SSDM.2007.G-9-2

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