Enhanced NBTI Degradation by SMT in Short-Channel pMOSFET

Chen-Shuo Huang; Po-Tsun Liu; Peng-Soon Lim; Chi-Chun Chen; H.J. Tao; Y.J. Mii

doi:https://doi.org/10.7567/SSDM.2007.P-3-15

2007 International Conference on Solid State Devices and Materials

2007年9月18日〜 2007年9月21日
Tsukuba International Congress Center (EPOCHAL TSUKUBA), Ibaraki, Japan

[P-3-15] Enhanced NBTI Degradation by SMT in Short-Channel pMOSFET

Chen-Shuo Huang、Po-Tsun Liu、Peng-Soon Lim、Chi-Chun Chen、H.J. Tao、Y.J. Mii (1.Institute of Electro-Optical Engineering, National Chiao Tung University、2.Department of Photonics and Display Institute, National Chiao Tung University、3.Taiwan Semiconductor Manufacturing Company)

https://doi.org/10.7567/SSDM.2007.P-3-15

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