[P-3-15] Enhanced NBTI Degradation by SMT in Short-Channel pMOSFET

Chen-Shuo Huang, Po-Tsun Liu, Peng-Soon Lim, Chi-Chun Chen, H.J. Tao, Y.J. Mii (1.Institute of Electro-Optical Engineering, National Chiao Tung University, 2.Department of Photonics and Display Institute, National Chiao Tung University, 3.Taiwan Semiconductor Manufacturing Company)

https://doi.org/10.7567/SSDM.2007.P-3-15