[P-3-16] Effects of hot carriers on DC and RF performances of deep submicron PMOSFET for low-power and high frequency applications

Mao-Chyuan Tang, Yean-Kuen Fang, David Chen, C S Yeh, S C Chien (1.VLSI Technology Laboratory, Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, 2.Central R & D Division, United Microelectronics Corp.)

https://doi.org/10.7567/SSDM.2007.P-3-16