[P-3-16] Effects of hot carriers on DC and RF performances of deep submicron PMOSFET for low-power and high frequency applications

Mao-Chyuan Tang、Yean-Kuen Fang、David Chen、C S Yeh、S C Chien (1.VLSI Technology Laboratory, Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University、2.Central R & D Division, United Microelectronics Corp.)

https://doi.org/10.7567/SSDM.2007.P-3-16