[P-3-17] NBTI-Stress Induced Grain-Boundary Degradation in Low-Temperature Poly-Si Thin-Film Transistors

Chih-Yang Chen, Ming-Wen Ma, Wei-Cheng Chen, Hsiao-Yi Lin, Kuan-Lin Yeh, Shen-De Wang, Tan-Fu Lei (1.Institute of Electronics, National Chiao Tung University, 2.Toppoly Optoelectronics Corp.)

https://doi.org/10.7567/SSDM.2007.P-3-17