[P-3-17] NBTI-Stress Induced Grain-Boundary Degradation in Low-Temperature Poly-Si Thin-Film Transistors

Chih-Yang Chen、Ming-Wen Ma、Wei-Cheng Chen、Hsiao-Yi Lin、Kuan-Lin Yeh、Shen-De Wang、Tan-Fu Lei (1.Institute of Electronics, National Chiao Tung University、2.Toppoly Optoelectronics Corp.)

https://doi.org/10.7567/SSDM.2007.P-3-17