[P-3-19] Accurate Extraction of Mobility, Effective Channel Length, and Source/Drain Resistance in 60 nm MOSFETs

Junsoo Kim、Jaehong Lee、Yeonam Yun、Byung-Gook Park、Jong Duk Lee、Hyungcheol Shin (1.Nano Systems Institutes, and School of EE, Seoul National University)

https://doi.org/10.7567/SSDM.2007.P-3-19