[P-3-24] Mechanism and Reliability Index of Hot-Carrier Degradation in LDMOS Transistors

Kuen-Shiuan Tian, Jone F. Chen, Wei-Chieh Wang, Shiang-Yu Chen, Kuo-Ming Wu, J. R. Lee, C. M. Liu, S. L. Hsu (1.Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, 2.Taiwan Semiconductor Manufacturing Company)

https://doi.org/10.7567/SSDM.2007.P-3-24