Mechanism and Reliability Index of Hot-Carrier Degradation in LDMOS Transistors

Kuen-Shiuan Tian; Jone F. Chen; Wei-Chieh Wang; Shiang-Yu Chen; Kuo-Ming Wu; J. R. Lee; C. M. Liu; S. L. Hsu

doi:https://doi.org/10.7567/SSDM.2007.P-3-24

2007 International Conference on Solid State Devices and Materials

2007年9月18日〜 2007年9月21日
Tsukuba International Congress Center (EPOCHAL TSUKUBA), Ibaraki, Japan

[P-3-24] Mechanism and Reliability Index of Hot-Carrier Degradation in LDMOS Transistors

Kuen-Shiuan Tian、Jone F. Chen、Wei-Chieh Wang、Shiang-Yu Chen、Kuo-Ming Wu、J. R. Lee、C. M. Liu、S. L. Hsu (1.Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University、2.Taiwan Semiconductor Manufacturing Company)

https://doi.org/10.7567/SSDM.2007.P-3-24

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