Anomalous Hot-Carrier-Induced On-Resistance Degradation in High-Voltage LDMOS Transistors

Shiang-Yu Chen; Jone F. Chen; Kuo-Ming Wu; J. R. Lee; C. M. Liu; S. L. Hsu

doi:https://doi.org/10.7567/SSDM.2007.P-3-25

2007 International Conference on Solid State Devices and Materials

2007年9月18日〜 2007年9月21日
Tsukuba International Congress Center (EPOCHAL TSUKUBA), Ibaraki, Japan

[P-3-25] Anomalous Hot-Carrier-Induced On-Resistance Degradation in High-Voltage LDMOS Transistors

Shiang-Yu Chen、Jone F. Chen、Kuo-Ming Wu、J. R. Lee、C. M. Liu、S. L. Hsu (1.Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University、2.Taiwan Semiconductor Manufacturing Company)

https://doi.org/10.7567/SSDM.2007.P-3-25

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