[P-3-25] Anomalous Hot-Carrier-Induced On-Resistance Degradation in High-Voltage LDMOS Transistors

Shiang-Yu Chen, Jone F. Chen, Kuo-Ming Wu, J. R. Lee, C. M. Liu, S. L. Hsu (1.Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, 2.Taiwan Semiconductor Manufacturing Company)

https://doi.org/10.7567/SSDM.2007.P-3-25