The Japan Society of Applied Physics

[P-3-25] Anomalous Hot-Carrier-Induced On-Resistance Degradation in High-Voltage LDMOS Transistors

Shiang-Yu Chen、Jone F. Chen、Kuo-Ming Wu、J. R. Lee、C. M. Liu、S. L. Hsu (1.Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University、2.Taiwan Semiconductor Manufacturing Company)

https://doi.org/10.7567/SSDM.2007.P-3-25