The Japan Society of Applied Physics

[P-3-26] Analysis of Temperature Effects on the High-Frequency Characteristics of RF LDMOS Transistors

Hsin-Hui Hu, Kun-Ming Chen, Guo-Wei Huang, Chun-Yen Chang, Yii-Chian Lu, Yu-Chi Yang, Eric Cheng (1.Department of Electronics Engineering, National Chiao Tung University, 2.National Nano Device Laboratories, 3.United Microelectronics Corporation)

https://doi.org/10.7567/SSDM.2007.P-3-26