The Japan Society of Applied Physics

[P-3-26] Analysis of Temperature Effects on the High-Frequency Characteristics of RF LDMOS Transistors

Hsin-Hui Hu、Kun-Ming Chen、Guo-Wei Huang、Chun-Yen Chang、Yii-Chian Lu、Yu-Chi Yang、Eric Cheng (1.Department of Electronics Engineering, National Chiao Tung University、2.National Nano Device Laboratories、3.United Microelectronics Corporation)

https://doi.org/10.7567/SSDM.2007.P-3-26