[P-3-9] Investigation of Impact Ionization in Strained-Si nMOSFETs

Ting-Kuo Kang, Yu-Huan Sa, Po-Chin Huang, San-Lein Wu, Shoou Jinn Chang (1.Department of Electronic Engineering, Cheng Shiu University, 2.Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University)

https://doi.org/10.7567/SSDM.2007.P-3-9