[A-3-1] Dopant and Potential Profiling with Atomic Resolution by Scanning Tunneling Microscopy (Invited)

T. Kanayama¹, M. Nishizawa¹, L. Bolotov¹ (1.MIRAI-AIST, Japan)

https://doi.org/10.7567/SSDM.2008.A-3-1