[B-10-3] Accurate Channel Thermal Noise Modeling in BSIM4
J. Jeon1, J. Lee1, C. H. Park2, J. S. Yoon3, H. Lee3, H. Oh3, B. G. Park1, H. Shin1
(1.Seoul National Univ., 2.Kwangwoon Univ., 3.Samsung Electronics Co., Ltd., Korea)
https://doi.org/10.7567/SSDM.2008.B-10-3