Analysis of V<sup>th</sup> Fluctuation at High Temperature using Takeuchi Plot

T. Tsunomura; A. Nishida; K. Takeuchi; S. Inaba; A. T. Putra; S. Kamohara; K. Terada; T. Hiramoto; T. Mogami

doi:https://doi.org/10.7567/SSDM.2008.B-7-1

2008 International Conference on Solid State Devices and Materials

Sep 23, 2008 - Sep 26, 2008
Tsukuba International Congress Center (EPOCHAL TSUKUBA), Ibaraki, Japan

[B-7-1] Analysis of V^th Fluctuation at High Temperature using Takeuchi Plot

T. Tsunomura¹, A. Nishida¹, K. Takeuchi¹, S. Inaba¹, A. T. Putra³, S. Kamohara¹, K. Terada², T. Hiramoto^1,3, T. Mogami¹ (1.MIRAI-Selete, 2.Hiroshima City Univ., 3.Univ. of Tokyo, Japan)

https://doi.org/10.7567/SSDM.2008.B-7-1

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2008 International Conference on Solid State Devices and Materials

[B-7-1] Analysis of Vth Fluctuation at High Temperature using Takeuchi Plot

[B-7-1] Analysis of V^th Fluctuation at High Temperature using Takeuchi Plot