Analysis of V<sup>th</sup> Fluctuation at High Temperature using Takeuchi Plot

T. Tsunomura; A. Nishida; K. Takeuchi; S. Inaba; A. T. Putra; S. Kamohara; K. Terada; T. Hiramoto; T. Mogami

doi:https://doi.org/10.7567/SSDM.2008.B-7-1

2008 International Conference on Solid State Devices and Materials

2008年9月23日〜 2008年9月26日
Tsukuba International Congress Center (EPOCHAL TSUKUBA), Ibaraki, Japan

[B-7-1] Analysis of V^th Fluctuation at High Temperature using Takeuchi Plot

T. Tsunomura¹、A. Nishida¹、K. Takeuchi¹、S. Inaba¹、A. T. Putra³、S. Kamohara¹、K. Terada²、T. Hiramoto^1,3、T. Mogami¹ (1.MIRAI-Selete、2.Hiroshima City Univ.、3.Univ. of Tokyo, Japan)

https://doi.org/10.7567/SSDM.2008.B-7-1

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2008 International Conference on Solid State Devices and Materials

[B-7-1] Analysis of Vth Fluctuation at High Temperature using Takeuchi Plot

[B-7-1] Analysis of V^th Fluctuation at High Temperature using Takeuchi Plot