[C-1-4] Aberration Corrected Microscopy and Spectroscopy for Pico-meter Characterization of Device Materials - Coductance Quantization of Metal Nanowire and AtomicChain - (Invited)
K. Takayanagi1, Y. Kurui1, Y. Ohshima1, Y. Tanishiro1
(1.Tokyo Tech., Japan)
https://doi.org/10.7567/SSDM.2008.C-1-4
