[C-1-4] Aberration Corrected Microscopy and Spectroscopy for Pico-meter Characterization of Device Materials - Coductance Quantization of Metal Nanowire and AtomicChain - (Invited)

K. Takayanagi¹、Y. Kurui¹、Y. Ohshima¹、Y. Tanishiro¹ (1.Tokyo Tech., Japan)

https://doi.org/10.7567/SSDM.2008.C-1-4