[E-1-5] Continuous Wave Spectroscopic Method for Measuring the Carrier Lifetime in Quantum Dot Devices

R. R. Alexander¹、D. T. D. Childs¹、T. L. Choi¹、R. A. Hogg¹ (1.Univ. of Sheffield, UK)

https://doi.org/10.7567/SSDM.2008.E-1-5