The Japan Society of Applied Physics

[G-2-6] Effect of Nonideality of the Gate-2DEG Channel Capacitance on the Frequency of Plasma Oscillations in the Plasma Wave Devices

T. Nishimura1, N. Magome1, I. Khmyrova2, T. Suemitsu1, W. Knap1,3, T. Otsuji1 (1.Tohoku Univ., 2.Univ. of Aizu, Japan, 3.Univ. Montpellier2, France)

https://doi.org/10.7567/SSDM.2008.G-2-6