[G-2-6] Effect of Nonideality of the Gate-2DEG Channel Capacitance on the Frequency of Plasma Oscillations in the Plasma Wave Devices

T. Nishimura¹、N. Magome¹、I. Khmyrova²、T. Suemitsu¹、W. Knap^1,3、T. Otsuji¹ (1.Tohoku Univ.、2.Univ. of Aizu, Japan、3.Univ. Montpellier2, France)

https://doi.org/10.7567/SSDM.2008.G-2-6