[G-2-6] Effect of Nonideality of the Gate-2DEG Channel Capacitance on the Frequency of Plasma Oscillations in the Plasma Wave Devices

T. Nishimura¹, N. Magome¹, I. Khmyrova², T. Suemitsu¹, W. Knap^1,3, T. Otsuji¹ (1.Tohoku Univ., 2.Univ. of Aizu, Japan, 3.Univ. Montpellier2, France)

https://doi.org/10.7567/SSDM.2008.G-2-6