[G-6-2] Precise C-V Analysis of Insulated-gate/AlGaN/GaN Interfaces

M. Miczek¹、B. Adamowicz¹、C. Mizue²、T. Hashizume² (1.Silesian Univ. of Tech., Poland、2.Hokkaido Univ., Japan)

https://doi.org/10.7567/SSDM.2008.G-6-2