[H-1-6] Charge Injection and Emission Characteristics of Hybrid Floating Gate Stack Consisting of NiSi-Nanodots and Silicon-Quantum-Dots

M. Ikeda¹, R. Matsumoto¹, K. Shimanoe¹, K. Makihara¹, S. Miyazaki¹ (1.Hiroshima Univ., Japan)

https://doi.org/10.7567/SSDM.2008.H-1-6