[J-9-1] Interpretation of Resistive Switching in NiO Thin Films (Invited)

I. K. Yoo¹, B. S. Khang¹, M. J. Lee¹, Y. D. Park¹, Y. S. Park¹ (1.Samsung Electronics Co., Ltd., Korea)

https://doi.org/10.7567/SSDM.2008.J-9-1