The Japan Society of Applied Physics

[P-2-4] Si-H Group Elimination Effect on the Properties of SiOCH Films: Theoretical Investigation

N. Tajima1, M. Shinriki2, Y. Xu3, T. Ohno1 (1.NIMS, 2.Taiyo Nippon Sanso Corp., 3.Tri Chemical Labs. Inc., Japan)

https://doi.org/10.7567/SSDM.2008.P-2-4