[P-3-11] Demonstration of High Mobility Holes in a Strained Ge Channel Grown on a Novel Thin and Relaxed SiGe/LT-SiGe/Si(001) Virtual Substrate
M. Myronov1、D. R. Leadley1、Y. Shiraki2
(1.Univ. of Warwick, UK、2.Musashi Inst. of Tech., Japan)
https://doi.org/10.7567/SSDM.2008.P-3-11