The Japan Society of Applied Physics

[P-3-4] Minority Carrier Response Characteristics in Germanium MOS Capacitor

C. C. Cheng1, C. H. Chien1,2, G. L. Luo2, H. C. Chiang1, H. S. Chen1, C. L. Lin1, C. C. Kei3, C. N. Hsiao3, C. Y. Chang1 (1.National Chiao Tung Univ., 2.National Nano Device Labs., 3.National Applied Res. Labs., Taiwan)

https://doi.org/10.7567/SSDM.2008.P-3-4