The Japan Society of Applied Physics

[P-6-10] Below-Gap Levels in InGaAs High-Electron-Mobility Transistors Observed by Two-Wavelength Excited Photoluminescence

T. Yamaguchi1、A. Okamato1、T. Fukuda1、T. Takada2、T. Itatani3、N. Kamata1 (1.Saitama Univ.、2.Sumitomo Chemical Co., Ltd.、3.AIST, Japan)

https://doi.org/10.7567/SSDM.2008.P-6-10