The Japan Society of Applied Physics

[A-3-2] Influence of Carbon in in-situ Carbon Doped SiGe (SiGe:C) Films on Si (001) Substrates on Epitaxial Growth Characteristics

H. Oomae1、H. Itokawa2、I. Mizushima2、S. Nakamura3、N. Uchitomi1 (1.Nagaoka Univ. of Tech.(Japan)、2.Toshiba Corp.(Japan)、3.Aoyama Gakuin Univ.(Japan))

https://doi.org/10.7567/SSDM.2009.A-3-2