[B-1-1] Microscopic Characterization of Devices by Scanning Transmission Electron Microscopy: From Single Atom Imaging to Macroscopic Properties
S. J. Pennycook1, K. van Benthem1, A. G. Marinopoulos1, S. T. Pantelides1
(1.Oak Ridge National Lab.)
https://doi.org/10.7567/SSDM.2009.B-1-1
