[B-1-1] Microscopic Characterization of Devices by Scanning Transmission Electron Microscopy: From Single Atom Imaging to Macroscopic Properties

S. J. Pennycook¹、K. van Benthem¹、A. G. Marinopoulos¹、S. T. Pantelides¹ (1.Oak Ridge National Lab.)

https://doi.org/10.7567/SSDM.2009.B-1-1