[C-7-4] Impact of Attractive Ion in Undoped Channel on the Characteristics of Nanoscale Multi-Gate FETs: A 3D NEGF Study

Y. Kamakura¹、G. Mil'nikov¹、N. Mori¹、K. Taniguchi¹ (1.Osaka Univ.)

https://doi.org/10.7567/SSDM.2009.C-7-4