[C-8-1] Impact of Coulomb Scattering on the Characteristics of Nanoscale Devices

F. Boeuf¹, G. Ghibaudo², T. Skotnicki¹ (1.STMicroelectronics(France), 2.IMEP-LAHC MINATEC(France))

https://doi.org/10.7567/SSDM.2009.C-8-1