[C-8-4] Experimental Study on Hall Factor in Ultrathin-Body SOI n-MOSFETs

S. Kobayashi¹, M. Saitoh¹, Y. Nakabayashi¹, T. Ishihara¹, T. Numata¹, K. Uchida² (1.Toshiba Corp.(Japan), 2.Tokyo Tech(Japan))

https://doi.org/10.7567/SSDM.2009.C-8-4