[E-9-3] Random Telegraph Signal and Low Frequency Noise in Silicon Charge-Sensitive Electrometers

N. Clement¹, K. Nishiguchi², A. Fujiwara², D. Vuillaume¹ (1.IEMN(France), 2.NTT Basic Res. Labs.(Japan))

https://doi.org/10.7567/SSDM.2009.E-9-3