[F-2-3] Field-Induced Electron Spin Resonance Spectroscopy for Density of Trap States in Organic Transistors

H. Matsui^1,2、A. S. Mishchenko^3,4、T. Hasegawa¹ (1.AIST(Japan)、2.Univ. of Tokyo(Japan)、3.RIKEN(Japan)、4.RRC Kurchatov Inst.(Russia))

https://doi.org/10.7567/SSDM.2009.F-2-3