[F-2-3] Field-Induced Electron Spin Resonance Spectroscopy for Density of Trap States in Organic Transistors

H. Matsui^1,2, A. S. Mishchenko^3,4, T. Hasegawa¹ (1.AIST(Japan), 2.Univ. of Tokyo(Japan), 3.RIKEN(Japan), 4.RRC Kurchatov Inst.(Russia))

https://doi.org/10.7567/SSDM.2009.F-2-3