[F-7-5] Interface Trap Reduction based on Poly(styrene-co-methyl methacrylate)/Hafnium Oxide Bilayer Dielectrics for Low Voltage OTFT

T. H. Huang¹, Z. Pei¹, W. K. Lin¹, S. T. Chang¹, K. C. Liu² (1.National Chung Hsing Univ.(Taiwan), 2.Chang Gung Univ.(Taiwan))

https://doi.org/10.7567/SSDM.2009.F-7-5