[F-7-5] Interface Trap Reduction based on Poly(styrene-co-methyl methacrylate)/Hafnium Oxide Bilayer Dielectrics for Low Voltage OTFT

T. H. Huang¹、Z. Pei¹、W. K. Lin¹、S. T. Chang¹、K. C. Liu² (1.National Chung Hsing Univ.(Taiwan)、2.Chang Gung Univ.(Taiwan))

https://doi.org/10.7567/SSDM.2009.F-7-5